153 lines
4.3 KiB
C++
153 lines
4.3 KiB
C++
// Copyright (c) 2012-2015, The CryptoNote developers, The Bytecoin developers
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//
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// This file is part of Bytecoin.
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//
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// Bytecoin is free software: you can redistribute it and/or modify
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// it under the terms of the GNU Lesser General Public License as published by
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// the Free Software Foundation, either version 3 of the License, or
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// (at your option) any later version.
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//
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// Bytecoin is distributed in the hope that it will be useful,
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// but WITHOUT ANY WARRANTY; without even the implied warranty of
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// MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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// GNU Lesser General Public License for more details.
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//
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// You should have received a copy of the GNU Lesser General Public License
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// along with Bytecoin. If not, see <http://www.gnu.org/licenses/>.
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#include "gtest/gtest.h"
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#include <boost/lexical_cast.hpp>
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// epee
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#include <string_tools.h>
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using namespace epee::string_tools;
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namespace
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{
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template<typename T>
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void do_pos_test(T expected, const std::string& str)
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{
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T val;
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ASSERT_TRUE(get_xtype_from_string(val, str));
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ASSERT_EQ(expected, val);
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}
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template<typename T>
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void do_neg_test(const std::string& str)
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{
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T val;
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ASSERT_FALSE(get_xtype_from_string(val, str));
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}
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}
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#define TEST_pos(int_type, expected, str) \
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TEST(get_xtype_from_string, handles_pos_ ## int_type ## _ ## expected) \
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{ \
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do_pos_test<int_type>(expected, str); \
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}
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#define DO_MAKE_NEG_TEST_NAME(prefix, int_type, ln) prefix ## int_type ## _ ## ln
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#define MAKE_NEG_TEST_NAME(prefix, int_type, ln) DO_MAKE_NEG_TEST_NAME(prefix, int_type, ln)
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#define TEST_neg(int_type, str) \
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TEST(get_xtype_from_string, MAKE_NEG_TEST_NAME(handles_neg, int_type, __LINE__)) \
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{ \
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do_neg_test<int_type>(str); \
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}
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TEST_pos(uint16_t, 0, "0");
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TEST_pos(uint16_t, 1, "1");
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TEST_pos(uint16_t, 65535, "65535");
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TEST_neg(uint16_t, "");
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TEST_neg(uint16_t, "+0");
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TEST_neg(uint16_t, "+1");
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TEST_neg(uint16_t, "+65535");
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TEST_neg(uint16_t, "+65536");
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TEST_neg(uint16_t, "-0");
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TEST_neg(uint16_t, "-1");
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TEST_neg(uint16_t, "-65535");
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TEST_neg(uint16_t, "-65536");
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TEST_neg(uint16_t, ".0");
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TEST_neg(uint16_t, ".1");
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TEST_neg(uint16_t, "0.0");
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TEST_neg(uint16_t, "0.1");
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TEST_neg(uint16_t, "1.0");
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TEST_neg(uint16_t, "1.1");
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TEST_neg(uint16_t, "w");
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TEST_neg(uint16_t, "0w");
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TEST_neg(uint16_t, "1w");
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TEST_neg(uint16_t, "1w1");
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TEST_neg(uint16_t, "65535w");
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TEST_neg(uint16_t, "65536");
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TEST_neg(uint16_t, "4294967296");
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TEST_neg(uint16_t, "18446744073709551616");
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TEST_pos(uint32_t, 0, "0");
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TEST_pos(uint32_t, 1, "1");
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TEST_pos(uint32_t, 4294967295, "4294967295");
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TEST_neg(uint32_t, "");
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TEST_neg(uint32_t, "+0");
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TEST_neg(uint32_t, "+1");
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TEST_neg(uint32_t, "+4294967295");
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TEST_neg(uint32_t, "+4294967296");
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TEST_neg(uint32_t, "-0");
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TEST_neg(uint32_t, "-1");
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TEST_neg(uint32_t, "-4294967295");
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TEST_neg(uint32_t, "-4294967296");
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TEST_neg(uint32_t, ".0");
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TEST_neg(uint32_t, ".1");
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TEST_neg(uint32_t, "0.0");
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TEST_neg(uint32_t, "0.1");
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TEST_neg(uint32_t, "1.0");
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TEST_neg(uint32_t, "1.1");
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TEST_neg(uint32_t, "w");
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TEST_neg(uint32_t, "0w");
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TEST_neg(uint32_t, "1w");
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TEST_neg(uint32_t, "1w1");
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TEST_neg(uint32_t, "4294967295w");
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TEST_neg(uint32_t, "4294967296");
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TEST_neg(uint32_t, "18446744073709551616");
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TEST_pos(uint64_t, 0, "0");
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TEST_pos(uint64_t, 1, "1");
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TEST_pos(uint64_t, 18446744073709551615ULL, "18446744073709551615");
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TEST_neg(uint64_t, "");
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TEST_neg(uint64_t, "+0");
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TEST_neg(uint64_t, "+1");
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TEST_neg(uint64_t, "+18446744073709551615");
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TEST_neg(uint64_t, "+18446744073709551616");
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TEST_neg(uint64_t, "-0");
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TEST_neg(uint64_t, "-1");
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TEST_neg(uint64_t, "-18446744073709551615");
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TEST_neg(uint64_t, "-18446744073709551616");
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TEST_neg(uint64_t, ".0");
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TEST_neg(uint64_t, ".1");
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TEST_neg(uint64_t, "0.0");
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TEST_neg(uint64_t, "0.1");
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TEST_neg(uint64_t, "1.0");
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TEST_neg(uint64_t, "1.1");
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TEST_neg(uint64_t, "w");
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TEST_neg(uint64_t, "0w");
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TEST_neg(uint64_t, "1w");
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TEST_neg(uint64_t, "1w1");
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TEST_neg(uint64_t, "18446744073709551615w");
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TEST_neg(uint64_t, "18446744073709551616");
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